Electromagnetic Measurements in the Near Field (Scitech Series on Electromagnetic Compatibility) Review
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This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understanding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it them presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. Electromagnetic Measurements in the Near Field is addressed to a wide range of specialists in biology, medicine, labor safety, environmental protection, metrologists, EMF meter designers, testers and users, and even for those who must make legal decisions on the grounds of measurement results interpretation.
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